008 |
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210813s1996 gw a f b 001 0 eng d |
010 |
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|a95044724
|
015 |
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|aGB96-52706
|
020 |
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|a354059129X|q(hbk.) : |cGIFT
|
040 |
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|aDLC|beng|dTWNTU
|
041 |
|
|aeng
|
050 |
00
|
|aQC611.6.O6|bC48 1995
|
082 |
04
|
|a537.622|bB344
|
095 |
|
|aNLB|bA9 |cH006410|d537.622|eB344|pBOOK|tDDC
|
100 |
|
|aBauer, Günther
|
245 |
00
|
|aOptical Characterization of Epitaxial Semiconductor Layers /|cBy Günther Bauer, Wolfgang Richter (eds.)
|
260 |
|
|aBerlin GW ;|aNew York :|bSpringer-Verlag,|c1996
|
300 |
|
|axiv, 429 p. :|bill. :|c24 cm
|
504 |
|
|aIncludes bibliographical references (p. [393]-422) and index
|
650 |
0
|
|aCrystal growth
|
650 |
0
|
|aSemiconductors|xOptical properties
|
650 |
0
|
|aHeterostructures
|
650 |
0
|
|aEpitaxy
|
653 |
0
|
|aSemiconductors
|
700 |
1
|
|aRichter, Wolfgang,
|
700 |
1
|
|aBauer, G.|q(Günther),
|