005 |
|
20070309100207.0 |
010 |
|
|a 2004040666
|
020 |
|
|a3540206620 :|cNT|3874
|
035 |
|
|a2004040666
|
040 |
|
|aTWNTU|cTWNTU|dTWNTU
|
042 |
|
|apcc
|
050 |
00
|
|aTA418.9.N35|bN3445 2004
|
082 |
00
|
|a620/.5|222
|
095 |
|
|aNTTU|bG|cE031633|d620.5|eN186:4|pBOOK|fCKY|zBOOK|m0|tDDC
|
245 |
00
|
|aNanoscale characterisation of ferroelectric materials :|bscanning probe microscopy approach /|cM. Alexe, A. Gruverman, eds.
|
260 |
|
|aBerlin ;|aNew York :|bSpringer-Verlag,|cc2004.
|
300 |
|
|axiii, 282 p. :|bill. (some col.) ;|c24 cm.
|
440 |
0
|
|aNanoscience and technology
|
504 |
|
|aIncludes bibliographical references and index.
|
650 |
0
|
|aNanostructured materials.
|
650 |
0
|
|aNanotechnology.
|
700 |
1
|
|aAlexe, M.|q(Marin)
|
700 |
1
|
|aGruverman, A.|q(Alexei)
|
809 |
|
|d620.5|eN186:4|tDDC|pBOOK
|