005 |
|
19981203145722.0 |
020 |
|
|a0127521593 (Pt. A)
|
020 |
|
|a0127521658 (Pt. B)
|
035 |
|
|aknowc11893118
|
040 |
|
|aTWNTU|cTWNTU|dTWNTU
|
095 |
|
|aNTTU|bG|cE026091|d621.38152|eI19|pBOOK|lv.2|fSYNSIA|zBOOK|m0|tDDC
|
245 |
00
|
|aIdentification of defects in semiconductors /|cvolume editor, Michael Stavola.
|
260 |
|
|aSan Diego :|bAcademic Press,|cc1998.
|
300 |
|
|a2 v. :|bill. ;|c24 cm.
|
490 |
0
|
|aSemiconductors and semimetals ;|vv. 51.
|
504 |
|
|aIncludes bibliographical references and indexes.
|
650 |
0
|
|aSemiconductors|xDefects.
|
700 |
1
|
|aStavola, Michael.
|
809 |
|
|d621.38152|eI19|lv.2|tDDC|pBOOK
|